Resolution 6 of the 21st CGPM (1999)

Requirements for dimensional metrology

The 21st Conférence Générale des Poids et Mesures,

considering that

• requirements for advanced dimensional metrology continue to increase,
• tolerances in high-technology manufacturing continue to fall and that in some areas they are already at the limit of what is possible today,
• the range over which such requirements exist extends inclusively from the domain of nanotechnology to the domain of geophysics,
• many different areas of metrology call upon realizations of SI derived units that themselves include the metre,
• the most demanding requirements in dimensional metrology often call for the realization of the metre by the simplest and the most direct way possible using stabilized lasers,
• to provide for the future and to ensure that the world's metrological system is capable of meeting future demand, continued basic research is essential,

recommends that national laboratories maintain a wide research base in length metrology that includes the maintenance and development of techniques to meet the diverse and growing demands in the field of dimensional metrology.

DOI : 10.59161/CGPM1999RES6E