The BIPM and OIML have published their first joint e-learning course
The BIPM and the International Organization of Legal Metrology (OIML) have published an e-learning course based on the BIPM and OIML joint publication: National Metrology Systems Developing the institutional and legislative framework (OIML D 1:2020).
The aim of the course is to assist countries and economies with emerging metrology systems (CEEMS), that are still in the process of developing or reshaping their national metrology systems (NMS), in preparation for effective participation in the international measurement system. This self-study course contains five e-learning modules. It provides information to national authorities, NMIs and other interested parties on the issues to be considered when developing policies regarding their national metrology systems, when setting up or re-shaping their institutions and when drawing up national laws related to metrology. The course is intended to be taken in the order of the modules. The course:
- lays out the importance of metrology (Module 1: Introduction and the importance of metrology),
- describes what is meant by a national metrology system and describes its components (Module 2: The concept of a national metrology system),
- places the system in the context of the wider international metrology system (Module 3: International aspects),
- describes the role of government and the policy options that may be available to national authorities (Module 4: The role of government and policy options for national authorities), and finally
- provides some options when developing legislation for metrology (Module 5: Options when legislating for metrology).
This joint BIPM-OIML e-learning course, “National Metrology Systems - Developing the institutional and legislative framework” is the outcome of a collaboration between the BIPM and OIML. The two organizations collaborate closely to present ‘one voice’ for metrology to the outside world. The goal of this joint knowledge transfer initiative is to offer appropriate information and advice to national authorities on the issues they should consider when producing policies aimed at developing their national metrology systems, setting up their institutions dealing with metrology within their jurisdictions and drawing up national laws related to metrology.
“In my time at the BIPM I had the opportunity to interact with many NMIs and government officials from countries that ranged from developing status to those with advanced economies. Perhaps the most common question I was asked was “What is the best way to organize an optimal national metrology system?” There is no single ‘right’ answer. It depends so much on the economic, scientific and social situation and, of course, the starting point and resources of the particular country. Even then there are many possibilities which could work. However, what is undeniable is that a successful institutional and legislative framework is the bedrock of everything that follows in a national metrology system. It was this understanding that motivated the joint BIPM and OIML document and development of this course. I hope these modules will make the formal document more accessible and assist in understanding the considerations that enable good choices to be made to best meet the particular needs of your country.”