BIPM Workshop: The Quantum Revolution in Metrology
28-29 September 2017 (at the BIPM)
Steering Committee
Sang-Kyung Choi
KRISS
Patrick Gill
NPL
Martin Milton (Chair)
BIPM
Maria-Luisa Rastello
INRIM
Uwe Siegner
PTB
Carl Williams
NIST
Workshop Executive Secretary
Pierre Gournay
BIPM
Focus Issue of Metrologia
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Focus on the Quantum Revolution in Metrology
Guest Editor: Pierre Gournay
Introduction
The objective of the workshop is to promote scientific exchange amongst the National Metrology Institutes and with leading researchers on the applications of quantum-based technologies to metrology.
Workshop sessions
The workshop was organized in five thematic sessions:
- Advances in quantum electrical standards, single-electron transistors and demonstrations of the quantum metrology triangle;
- Single-photon measurements, radiometry with entangled sources, superconducting particle detectors;
- Highly entangled systems for metrology, entangled optical clocks;
- Quantum standards for mass, force, pressure, vacuum, temperature, acoustics and vibration;
- Emerging ideas in quantum metrology.
Workshop documents
A single-emitter sub-shot noise quantum light source: press a button and get one photon
Stephan Götzinger (Max Planck Institute for Light, Germany)
The effect of turbulence in free-space synchronization, using second-order quantum interferenc
Filippus S. Roux (NMISA, South Africa)
Single photon detection without losing the count
Mauro Rajteri (INRIM, Italy)
Non-destructive detection for strontium optical lattice clocks: Towards a lattice clock in the quantum regime
Jérôme Lodewyck (LNE-SYRTE, France)
Towards creation of the nuclear clock and frequency reference point: Search for the optimal parameters today, working instruments of the future
Feodr F. Karpeshin, (VNIIM, Russia)
Optical-clock local-oscillator universal interrogation protocol for zero probe-field-induced frequency-shifts
Thomas Zanon-Willette (Observatoire de Paris, France)
How to optimize the shape of quantum light for quantum metrology
Claude Fabre (Laboratoire Kastler Brossel, France)
Impact of the new generation of Josephson voltage standards in ac and dc electric metrology
Al)ain Rüfenacht (NIST, USA)
Error modelling of quantum Hall array resistance standards
Martina Marzano (INRIM, Italy)
Distinction between electromagnetically induced transparency and Autler-Townes splitting: a conceptual approach
Satya kesh Dubey (CSIR-NPLI, India)
The robustness and universality of tunable-barrier electron pumps
Stephen Giblin (NPL, UK)
Quantum optical explorations of the nanoscale metrology frontier
Jacob Taylor (NIST/JQI, USA)
Searching for an invariant of the sample composition in the measurement of the amount of substance
Hong Yi (NIM, China)
Measuring a mole of photons: optical power traceable to the kilogram
John Lehman (NIST, USA)
Novel source of multimode squeezed light for quantum enhanced space-time positioning
Lucas La Volpe (Laboratoire Kastler Brossel, France)
see Session3: S3-08
Optical magnetometry beyond the shot noise limit
Ricardo Jimenez-Martinez (ICFO - The Institute of Photonic Sciences, Spain)
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