Workshop on Metrological Traceability

The Workshop id organized by the CIPM Forum on Metrology and Digitalization in partnership with IMEKO Technical Committees TC6 (Digitalization), TC8 (Traceability in Metrology), and TC21 (Mathematical Tools for Measurements).

Metrological traceability

Metrologically traceable measurements are essential when important societal decisions are based on physical data. The rigor of traceable measurements is crucial for making robust, reliable, and trustworthy decisions. But what exactly is traceable measurement, and how should it be represented in digital form? This question now concerns many people working on the digital transformation of measurement infrastructures. Should the digitalization of traceability aim to capture the processes that people follow today, or should it look beyond these day-to-day routines and consider the essence of traceability and how to achieve it with machines?

The workshop consists of two sessions, each followed by an open panel discussion.

• The first session examines traceability within the context of today’s measurement infrastructure. Starting from the traceability principles established in the late 20th century, panellists will explore how these concepts can be modelled and represented in digital form, leading to significant benefits for those at the ends of traceability chains.
• The second session will focus on new and emerging measurement system technologies. Panellists will discuss a range of systems, including intrinsic standards, sensor networks, virtual measuring systems, and virtual data spaces. Do these technologies challenge the traditional concept of traceability, or can the most important foundational principle of international quality infrastructures be applied to these systems too?

Online participation, time and date

The workshop will be held at the IMEKO World Congress venue, on Wednesday 28 August between 8 AM and 12 Noon (0600 UTC to 1000 UTC).

Online participation will be available using the Webex platform.

Programme

See the detailed programme below for more information.

Session 1: From foundational principles to digital traceability chains

• Metrological Timelines for visualizing and digitalizing metrological traceability - C. Ehrlich (NIST)
• Connecting a digital traceability chain together - Blair Hall (MSL)
• The concept of provenance in the context of metrological traceability - Ryan White (NRC)
• VNA Tools - a metrology software supporting the digital traceability chain - Marko Zeier (METAS)

Session 2: Traceability for emerging measurement technologies

• Traceability challenges for intrinsic, deployable standards - Barabara Goldstein (NIST)
• Traceability in data spaces - from individual measurements to a digital product passport - Sascha Eichstädt (PTB)
• Metrology for virtual measuring instruments - Sonja Schmelter (PTB)
• Reliable Methods for Real-World Sensor Networks - Shahin Tabandeh (VTT)