Dr Jennifer Decker
Consultative Committee for Length
Experts
From 15 to 16 September 2005
CGPM - Open Session
Participant
16 November 2018
BIPM Workshop on International needs for Metrology at the Nanoscale
Members
From 18 to 19 February 2010
Working Group on Dimensional Metrology
Excused
From 08 to 09 June 2009