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Bilateral comparison of 1.018 V and 10 V standards between SASO-NMCC (Saudi Arabia) and the BIPM, September to November 2023 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b)
Authors:
Solve S., Chayramy R., Stock M., Alrobaish A., Aljomaie A.
Bilateral comparison of 1.018 V and 10 V standards between INRIM (Italy) and the BIPM, November to December 2023 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b)
Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between the CEM (Spain) and the BIPM
Authors:
Rolland B., Stock M., Gournay P., Matías L., Hortelano A., Raso F., Díaz de Aguilar J.
Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between INRIM (Italy) and the BIPM
Authors:
Rolland B., Stock M., Gournay P., Capra P.P., Galliana F.
Bilateral comparison of 1.018 V and 10 V standards between CSIR-NPL (India) and the BIPM, April to June 2022 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b)
Authors:
Solve S., Chayramy R., Stock M., Aloysius R.P., Satish S., Patel S.M.
Bilateral comparison of 10 pF and 100 pF standards (ongoing BIPM key comparisons BIPM.EM-K14.a and 14.b) between the NMIM (Malaysia) and the BIPM
Authors:
Moreno J.A., Gournay P., Dewi M.K.
Bilateral comparison of 1.018 V and 10 V standards between DEFNAT (Tunisia) and the BIPM, April to June 2022 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b)
Authors:
Solve S., Chayramy R., Stock M., Zouaoui J.
Mise en pratique for the definition of the candela and associated derived units for photometric and radiometric quantities in the International System of Units (SI)
Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparison BIPM.EM-K13) between the NPLI (India) and the BIPM
Authors:
Rolland B., Stock M., Gournay P., Aloysius R.P., Kiran U., Hemavathi A., Awana V.P.S., Biswas J.C.
Bilateral comparison of 1.018 V and 10 V standards between the KEBS (Kenya) and the BIPM, January to March 2018, (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b)
Comparison of the Josephson voltage standards of the METAS and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.a and b)
Bilateral comparison of 10 pF and 100 pF standards (ongoing BIPM key comparisons BIPM.EM-K14.a and 14.b) between the SMD (Belgium) and the BIPM
Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between the SMD (Belgium) and the BIPM
Authors:
Bilateral comparison of 10 V standards between the NSAI-NML (Ireland) and the BIPM, March to April 2011 (part of the ongoing BIPM key comparison BIPM.EM-K11.b)
Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between the NSAI NML (Ireland) and the BIPM
Authors:
Bilateral comparison of 1.018 V and 10 V standards between the NSAI-NML (Ireland) and the BIPM, March to April 2010 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b)
Bilateral comparison of 10 V standards between the NML (Ireland) and the BIPM, April to May 2009 (part of the ongoing BIPM key comparison BIPM.EM-K11.b)
Authors:
Bilateral comparison of 10 V standards between the NSAI - NML (Ireland) and the BIPM, February 2016 (part of the ongoing BIPM key comparison BIPM.EM-K11.b)
Final report on the bilateral comparison of 100 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.b) between the NML, Ireland and the BIPM, June-October 2007
Authors:
Bilateral comparison of 10 kΩ standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the NML-Ireland and the BIPM
Bilateral comparison of 1 Ω standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the NML-Ireland and the BIPM
Bilateral Comparison of 1 V and 10 V Standards between the SMD (Belgium) and the BIPM October to December 2014 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b)
Bilateral comparison of 10 V standards between the NSAI-NML (Ireland) and the BIPM, March 2014 (part of the ongoing BIPM key comparison BIPM.EM-K11.b)
Bilateral comparison of 10 V standards between the NSAI–NML (Ireland) and the BIPM, January to February 2013 (part of the ongoing BIPM key comparison BIPM.EM-K11.b)
Bilateral comparison of 1 Ω standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the NSAI-NML (Ireland) and the BIPM
Bilateral comparison of 10 kΩ standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the NSAI-NML (Ireland) and the BIPM
Bilateral comparison of 10 V standards between the NSAI-NML (Ireland) and the BIPM, February to March 2012 (part of the ongoing BIPM key comparison BIPM.EM-K11.b)
Bilateral Comparison of 1.018 V and 10 V Standards between the SMD (Belgium) and the BIPM, October to December 2021 (part of the ongoing BIPM key comparison BIPM.EM-K11)
Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between the INMETRO (Brazil) and the BIPM
Authors:
Rolland B., Stock M., Gournay P., Coutinho de Oliveira V., Carvalho H.R., Landim R.P.
Differential sampling of AC waveforms based on a programmable Josephson voltage standard using a high-precision sampler
Authors:
Kim M.-S., Cho H., Solve S.
On-site comparison of Quantum Hall Effect resistance standards of the NMC A*STAR and the BIPM: Ongoing key comparison BIPM.EM-K12
Authors:
Gournay P., Rolland B., Chua S.W., Lim K.H., Teck E.T.B.
Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between the NSAI-NML (Ireland) and the BIPM
Authors:
Rolland B., Stock M., Gournay P., Power O., Walsh R.
Comparison of the Josephson voltage standards of the MIKES and the BIPM
Authors:
Solve S., Chayramy R., Immonen P., Nissilä J., Stock M., Manninen A.
Bilateral comparison of 10 V standards between the NSAI-NML (Ireland) and the BIPM
Bilateral comparison of 1.018 V and 10 V standards between the BIM (Bulgaria) and the BIPM (BIPM.EM-K11.a and b)
Authors:
Solve S., Chayramy R., Hadzhistoykova R., Marinov R., Stock M.
Bilateral comparison of 10 pF and 100 pF standards (ongoing BIPM key comparisons BIPM.EM-K14.a and 14.b) between the SASO (Saudi Arabia) and the BIPM
Authors:
Moreno J.A., Gournay P., AlAylia A.
Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between the NMC A*STAR (Singapore) and the BIPM
Authors:
Rolland B., Stock M., Chua S.W., Lim K.H., Tan E.
Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between the EMI (United Arab Emirates) and the BIPM
Authors:
Rolland B., Stock M., Gournay P., Bartholomew J., Al Kalbani W., Al Kayyoomi S.
Measurement configurations for differential sampling of AC waveforms based on a programmable Josephson voltage standard: effects of sampler bandwidth on the measurements
Authors:
Kim M.-S., Cho H., Chayramy R., Solve S.
Bilateral Comparison of 1 V and 10 V Standards between the JV (Norway) and the BIPM, January to February 2015 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b)
Authors:
Solve S., Chayramy R., Stock M., Sengebush F.
Bilateral Comparison of 10 V Standards between the NSAI - NML (Ireland) and the BIPM, March 2015 (part of the ongoing BIPM key comparison BIPM.EM-K11.b)
On-site comparison of quantum Hall effect resistance standards of the NRC-CNRC and the BIPM: ongoing key comparison BIPM.EM-K12
Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between the NMISA (South Africa) and the BIPM
Authors:
Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between the BIM (Bulgaria) and the BIPM
Authors:
Rolland B., Fletcher N., Tenev A., Hadzhistoykova R.
Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between the NSAI-NML (Ireland) and the BIPM
Comparison of the Josephson voltage standards of the NIMT and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b)
Authors:
Solve S., Chayramy R., Stock M., Pimsut S., Rujirat N.
Bilateral comparison of 10 pF and 100 pF standards (ongoing BIPM key comparisons BIPM.EM-K14.a and 14.b) between the NMISA (South Africa) and the BIPM
Authors:
Bilateral comparison of 10 V standards between the NSAI-NML (Ireland) and the BIPM (BIPM.EM-K11.b)
Bilateral comparison of 100 pF standards (ongoing BIPM key comparison BIPM.EM-K14.b) between the NSAI-NML (Ireland) and the BIPM
Authors:
On-site comparison of Quantum Hall Effect resistance standards of the NMIJ-AIST and the BIPM: Ongoing key comparison BIPM.EM-K12
Authors:
Gournay P., Rolland B., Oe T., Kaneko N.-H.
On-site comparison of quantum Hall effect resistance standards of the CMI and the BIPM: ongoing key comparison BIPM.EM-K12
Authors:
Gournay P., Rolland B., Kucera J., Vojackova L.
On-site comparison of quantum Hall effect resistance standards of the NIM and the BIPM: ongoing key comparison BIPM.EM-K12
Authors:
Gournay P., Rolland B., Lu Y., Zhao J.
On-site comparison of quantum Hall effect resistance standards of METAS and the BIPM: Ongoing key comparison BIPM.EM-K12
On-site comparison of quantum Hall effect resistance standards of the KRISS and the BIPM: ongoing key comparison BIPM.EM-K12
Authors:
Gournay P., Rolland B., Chae D.-H., Kim W.-S.
Comparison of the Josephson voltage standards of the NIST and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b)
Authors:
Solve S., Chayramy R., Stock M., Tang Y.H., Sims J.E.
Comparison of the Josephson voltage standards of the LNE and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b)
Authors:
Solve S., Chayramy R., Djorjevic S., Séron O.
Bilateral comparison of 1 Ω standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the NMIA (Australia) and the BIPM
Authors:
Goebel R., Fletcher N., Stock M., Pritchard B., Xie R., Coogan P., Johnson L.
Standard deviation of the mean and other time series properties of voltages measured with a digital lock-in amplifier
Authors:
Bilateral comparison of 1.018 V and 10 V standards between the INTI (Argentina) and the BIPM, August to October 2009 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b)
Authors:
Tonina A., Iuzzolino R., Bierzychudek M., Real M., Solve S., Chayramy R., Stock M.
Bilateral comparison of 100 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.b) between the CMI, Czech Republic and the BIPM, January-July 2009
Authors:
Bilateral comparison of 10 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.a) between the CMI, Czech Republic and the BIPM, January-July 2009
Authors:
Comparison of the Josephson voltage standards of the SMD and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b)
Authors:
Solve S., Chayramy R., Stock M., Nicolas J., Van Theemsche A.
Comparison of the Josephson voltage standards of the EIM and the BIPM
Authors:
Solve S., Chayramy R., Stock M., Holiastou M., Flouda I.
Final report on bilateral comparison of 10 kΩ standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the NIMT-Thailand and the BIPM
Authors:
Goebel R., Kurupakorn C., Fletcher N., Stock M.
Bilateral comparison of 10 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.a) between the NIST, United States and the BIPM, June 2007-March 2008
Authors:
Fletcher N., Goebel R., Wang Y.
Comparison of the Josephson voltage standards of the NMC, A*STAR and the BIPM (part of the ongoing BIPM key comparisons BIPM.EM-K10.a and BIPM.EM-K10.b)
Authors:
Solve S., Chayramy R., Stock M., Zhou Y., Lee J., Wey Chua S.
Comparison of the Josephson voltage standards of the VNIIM and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b)
Authors:
Solve S., Chayramy R., Stock M., Katkov A.
Bilateral comparison of 10 kΩ standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the GUM (Poland) and the BIPM
Authors:
Goebel R., Fletcher N., Stock M., Dudek E., Domanska-Mysliwiec D., Mosiadz M., Orzepowski M.
Bilateral comparison of 1 Ω standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the GUM (Poland) and the BIPM
Authors:
Goebel R., Fletcher N., Stock M., Dudek E., Domanska-Mysliwiec D., Mosiadz M., Orzepowski M.
Comparison of the Josephson voltage standards of the CMI and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b)
Authors:
Solve S., Chayramy R., Stock M., Streit J., Šíra M.
Comparison of the Josephson voltage standards of the INTI and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.a)
Authors:
Solve S., Chayramy R., Stock M., Iuzzolino R., Tonina A.
Comparison of the Josephson voltage standards of the MSL and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b)
Authors:
Solve S., Chayramy R., Stock M., Christian L.
Comparison of the Josephson voltage standards of the CENAM and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b)
Authors:
Solve S., Chayramy R., Stock M., Avilés D., Navarrete E., Hernández D.
Precision comparison of the quantum Hall effect in graphene and gallium arsenide
Authors:
Janssen T.J.B.M., Williams J.M., Fletcher N.E., Goebel R., Tzalenchuk A., Yakimova R., Lara-Avila S., Kubatkin S., Fal'ko V.I.
Bilateral comparison of 10 kΩ standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the KRISS (Rep. of Korea) and the BIPM
Authors:
Goebel R., Kim W.-S., Fletcher N., Stock M.
Direct comparison of two NIST PJVS systems at 10 V
Comparison of the Josephson voltage standards of the NIM and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b)
Authors:
Solve S., Chayramy R., Stock M., Yuan G., Honghui L., Zengmin W.
Bilateral comparison of 1 V and 10 V standards between the INM (Romania) and the BIPM, August to October 2013 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b)
Authors:
Solve S., Chayramy R., Stock M., Simionescu M., Cirneanu L.
Final report on the on-going comparison BIPM.EM-K12: Comparison of quantum Hall effect resistance standards of the PTB and the BIPM
Authors:
Goebel R., Fletcher N., Rolland B., Götz M., Pesel E.
Comparison of the Josephson voltage standards of the INM and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b)
Authors:
Solve S., Chayramy R., Stock M., Simionescu M., Cîrneanu L.
Bilateral Comparison of 1 V and 10 V Standards between the NIMT (Thailand) and the BIPM October to December 2014 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b)
Authors:
Solve S., Chayramy R., Stock M., Pimsut S.
Bilateral comparison of 1 V and 10 V standards between the DMDM (Serbia) and the BIPM, January to March 2014 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b)
Authors:
Solve S., Chayramy R., Stock M., Pantelic-Babic J., Sofranac Z., Zivkovic V.
Comparison of the Josephson Voltage Standards of the PTB and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b)
Authors:
Solve S., Chayramy R., Stock M., Palafox L., Behr R.
Bilateral comparison of 1 V and 10 V standards between the NIS (Egypt) and the BIPM, August to September 2014 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b)
Authors:
Solve S., Chayramy R., Stock M., Mageed H.M.A., Aladdin O.M., Raouf M.H.A.
Bilateral comparison of 10 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.a) between the BIM, Bulgaria, and the BIPM, April 2012 to September 2012
Authors:
Sapunova I., Fletcher N., Goebel R., Stock M.
Bilateral comparison of 100 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.b) between the BIM, Bulgaria, and the BIPM, April 2012 to September 2012
Authors:
Sapunova I., Fletcher N., Goebel R., Stock M.
Bilateral comparison of 100 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.b) between the NPLI and the BIPM, July 2010-May 2011
Authors:
Saleem M., Ansari M.A., Saxena A.K., Fletcher N., Goebel R., Stock M.
Bilateral comparison of 10 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.a) between the NPLI and the BIPM, July 2010-May 2011
Authors:
Saleem M., Ansari M.A., Saxena A.K., Fletcher N., Goebel R., Stock M.
Bilateral comparison of 100 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.b) between the NSAI-NML, Ireland, and the BIPM, March-August 2011
Authors:
Power O., Moran A., Fletcher N., Goebel R., Stock M.
Bilateral comparison of 10 pF capacitance standards (ongoing BIPM key comparison BIPM.EM-K14.a) between the NSAI-NML, Ireland, and the BIPM, March-August 2011
Authors:
Power O., Moran A., Fletcher N., Goebel R., Stock M.
Behavior of 1 Ω resistors at frequencies below 1 Hz and the problem of assigning a dc value
Authors:
Fletcher N., Götz M., Rolland B., Pesel E.
Comparison of the Josephson Voltage Standards of the DMDM and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b)
Authors:
Solve S., Chayramy R., Stock M., Pantelic-Babic J., Sofranac Z., Cincar Vujovic T.
Bilateral comparison of 1 V and 10 V standards between the DEFNAT (Tunisia) and the BIPM February to March 2016 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b)
Authors:
Solve S., Chayramy R., Ben Salah B., Mallat A., Abene L., Stock M.
Final report of the supplementary comparison EURAMET.EM-S31 comparison of capacitance and capacitance ratio
Authors:
Schurr J., Fletcher N., Gournay P., Thévenot O., Overney O., Johnson L., Xie R., Dierikx E.
Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between the CMI (Czech Republic) and the BIPM
Authors:
Rolland B., Fletcher N., Kučera J., Chrobok P., Vojčkov L.
Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between the NIMT (Thailand) and the BIPM
Authors:
Rolland B., Fletcher N., Khumthukthit N., Jassadajin C.
APMP key comparison of DC voltage at 1.018 V and 10 V
Authors:
Kyu-Tae Kim, Michitaka Maruyama, Stephane Solve, Louis Marais, Abdul Rashid B Zainal Abidin, Sze Wey Chua, Dennis Lee, Chun-feng Huang, Sittisak Pimsut, Seksembayev Nurlan
Bilateral comparison of 10 pF and 100 pF standards (ongoing BIPM key comparisons BIPM.EM-K14.a and 14.b) between the NIS (Egypt) and the BIPM
Authors:
Gournay P., Helmy M., Raouf A., Hamed H.A.M., Eliwa Gad A.
Bilateral comparison of 1 V and 10 V standards between the NMISA (South Africa) and the BIPM April to June 2017 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b)
Direct DC 10 V comparison between two programmable Josephson voltage standards made of niobium nitride (NbN)-based and niobium (Nb)-based Josephson junctions
Automated direct comparison of two cryocooled 10 volt programmable Josephson voltage standards
Authors:
Rüfenacht A., Tang Y.-h., Solve S., Fox A.E., Dresselhaus P.D., Burroughs C.J., Schwall R.E., Chayramy R., Benz S.P.
Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between the NIM (The People's Republic of China) and the BIPM
Authors:
Rolland B., Stock M., Yunfeng L., Jianting Z., Qing H.
Comparison CCEM-K4.2017 of 10 pF and 100 pF capacitance standards
Authors:
Gournay P., Rolland B., Chayramy R., Overney F., Yang Y., Huang L., Lu Z., Wang Y., Koffman A., Johnson L., Xie R., Belliss J., Giblin S., Thornton B., Schurr J., Lee J., Semenov Y.
Bilateral comparison of 10 pF and 100 pF standards (ongoing BIPM key comparisons BIPM.EM-K14.a and 14.b) between the NIMT (Thailand) and the BIPM
Authors:
Gournay P., Homklintian M.
Corrigendum: Behavior of 1 ohm resistors at frequencies below 1 Hz and the problem of assigning a dc value (2015 Metrologia 52 509-13)
Authors:
Fletcher N., Götz M., Rolland R., Pesel E.
Bilateral comparison of 1 Ω and 10 kΩ standards (ongoing BIPM key comparisons BIPM.EM-K13.a and 13.b) between the NPLI (India) and the BIPM
Authors:
Fletcher N., Goebel R., Saleem M., Singh H.K., Ansari M.A., Kiran U., Saxena A.K.
Erratum: Etalons représentatifs de l'ohm et du volt. Situation au 1er janvier 1977
Authors:
Leclerc G.
DC and AC Techniques for Resistance and Impedance Measurements
Authors:
Delahaye F.
Report on the 1990 International Comparison of 1 Ω and
Authors:
Delahaye F., Bournaud D., Witt T.J.
Final report on the bilateral comparison of 1 Ω standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the CMI (Czech Republic) and the BIPM
Authors:
Goebel R., Chrobok P., Fletcher N., Stock M.
Bilateral comparison of 10 kΩ standards (ongoing BIPM key comparison BIPM.EM-K13.b) between the CMI (Czech Republic) and the BIPM
Authors:
Goebel R., Chrobok P., Fletcher N., Stock M.
Linking the results of key comparison CCEM-K4 with the 10 pF results of EUROMET.EM-K4
Authors:
Delahaye F., Witt T.J.
EUROMET project no 429: Comparison of 10 V electronic voltage standards
Authors:
Liefrink F., Dierikx E.F., Heimeriks J.W., Eklund G., Flouda I., Funck T., Helistö P., Jakab A., Janssen J.-T., Jeanneret B., Jensen H.D., Hetland P.O., Lindic M., Lo-Hive J.-P., Nicolas J., Nunes M., Power O., Raso Alonso F.I., Reymann D., Selçik S., Stre
EUROMET EM.M-S1 - EUROMET Project No. 597: Comparison of magnetic flux by means of a coil transfer standard
Authors:
Kupec J., Ahlers H., Belliss J., Bryant S., Fiorillo F., Khorev V., Kohout V., Shifrin V., Weyand K.
Link between the comparison EUROMET.EM.BIPM-K11.b and the ongoing comparison BIPM.EM-K11.b
Authors:
Reymann D.
Final Report on CCT-K7: Key comparison of water triple point cells
Authors:
Stock M., Solve S., del Campo D., Chimenti V., Méndez-Lango E., Liedber H., Steur P.P.M., Marcarino P., Dematteis R., Filipe E., Lobo I., Kang K.H., Gam K.S., Kim Y.-G., Renaot E., Bonnier G., Valin M., White R., Dransfield T.D., Duan Y., Xiaoke Y., Strous
Final report on the CCPR-S2 supplementary comparison of area measurements of apertures for radiometry
Authors:
Litorja M., Fowler J., Hartmann J., Fox N., Stock M., Razet A., Khlevnoy B., Ikonen E., Machacs M., Doytchinov K.
Final report on the bilateral comparison of 1 Ω standards (ongoing BIPM key comparison BIPM.EM-K13.a) between the NIST (USA) and the BIPM
Authors:
GoebeL R., Elmquist R., Fletcher N., Stock M.
Comparison of the Josephson voltage standards of the KRISS and the BIPM (part of the ongoing BIPM key comparison BIPM.EM-K10.b)
Authors:
Solve S., Chayramy R., Stock M., Kim K.-T., Song W., Kim M.-S., Chong Y.
Bilateral comparison of 10 V standards between the NML (Ireland) and the BIPM, May to June 2008 (part of the ongoing BIPM key comparison BIPM.EM-K11.b)
Authors:
Power O., Murray J., Solve S., Chayramy R.
Bilateral comparison of 1.018 V and 10 V standards between the KRISS (Republic of Korea) and the BIPM, February 2008 (part of the ongoing BIPM key comparison BIPM.EM-K11.a and b)
Authors:
Solve S., Chayramy R., Stock M., Kim K.-T., Song W., Kim M.-S., Chong Y.
Direct comparison between a programmable and a conventional Josephson voltage standard at the level of 10 V
Authors:
Djordjevic S., Séron O., Solve S., Chayramy R.
Comparison of the Josephson voltage standards of the IEN and the BIPM
Authors:
Reymann D., Witt T.J., Andreone D., Cerri R., Godone A.
Revised technical guidelines for reliable dc measurements of the quantized Hall resistance
Authors:
Delahaye F., Jeckelmann B.
Accurate AC measurements of the quantized Hall resistance from 1 Hz to 1,6 kHz
Authors:
Delahaye F.
Comparison of quantum Hall effect resistance standards of the NIST and the BIPM
Authors:
Delahaye F., Witt T.J., Elmquist R.E., Dziuba R.F.
Résultat des 12e comparaisons des étalons nationaux de résistance et de force électromotrice effectuées au Bureau International des Poids et Mesures
Authors:
Terrien J.
Comparison of the Josephson voltage standards of the NIM (China) and the BIPM
Authors:
Reymann D., Xue S.Q., Liu R.M., Li H.H., Gao J., Zhou Y.Q., Witt T.J.
Comparison of quantum Hall effect resistance standards of the PTB and the BIPM
Authors:
Delahaye F., Witt T.J., Pesel E., Schumacher B., Warnecke P.
Comparison of quantum Hall effect resistance standards of the OFMET and the BIPM
Authors:
Delahaye F., Witt T.J., Jeckelmann B., Jeanneret B.
Comparisons of the Josephson voltage standard of the BIPM with those of the KRISS, the MSL and the NML
Authors:
Reymann D., Kim K.-T., Christian L.A., Frenkel R.B., Witt T.J.
Etalons représentatifs de l'ohm et du
Authors:
Leclerc G.
Using the autocorrelation function to characterize time series of voltage measurements
Authors:
Witt T.J.
International news - CPEM 2006 Round table discussion 'Proposed changes to the SI'
Authors:
Stock M., Witt T.J.
Controlling ac losses in quantum Hall effect devices
Authors:
Delahaye F., Kibble B.P., Zarka A.