CCEM-K2.2012
MEASURAND Resistance
NOMINAL VALUE 10 MΩ
Degrees of equivalence represented by Di = (xi - xR) and its expanded uncertainty Ui (k = 2), both expressed in ppm.
CCEM-K2.2012
MEASURAND Resistance
NOMINAL VALUE 1 GΩ
Degrees of equivalence represented by Di and its expanded uncertainty Ui (k = 2), both expressed in ppm.
CCEM-K2.2012
MEASURAND Resistance
NOMINAL VALUE 10 MΩ
Degrees of equivalence represented by Di = (xI - xR) and its expanded uncertainty Ui (k = 2), both expressed in ppm.
LABi | Di | Uneg,i | Upos,i | |
---|---|---|---|---|
10-6 |
10-6 |
10-6 |
||
NRC | 0.1 | 1.7 | ||
NIST | 0.3 | 1.7 | ||
CENAM | 0.9 | 1.8 | ||
INTI | 1.4 | 1.7 | ||
PTB | -0.6 | 1.8 | ||
NPL | -0.1 | 1.6 | ||
METAS | -0.4 | 1.7 | ||
VSL | 1.7 | 1.7 | ||
NMISA | -2 | 5.2 | ||
NIM | -0.3 | 2.2 | ||
VNIIM | -0.1 | 2.1 | ||
KRISS | -3 | 1.7 |
CCEM-K2.2012
MEASURAND Resistance
NOMINAL VALUE 1 GΩ
Degrees of equivalence represented by Di and its expanded uncertainty Ui (k = 2), both expressed in ppm.
LABi | Di | Uneg,i | Upos,i | |
---|---|---|---|---|
10-6 |
10-6 |
10-6 |
||
NRC | -0.9 | 4.2 | ||
NIST | -0.8 | 2.3 | ||
CENAM | 4.1 | 8.4 | ||
INTI | 8 | 5.8 | ||
PTB | -4.8 | 5.2 | ||
NPL | -0.6 | 1.9 | ||
METAS | -1 | 5.6 | ||
VSL | 4.2 | 2.5 | ||
NMISA | -12.2 | 9.3 | ||
NIM | -4.2 | 4.6 | ||
VNIIM | -0.6 | 4.8 | ||
KRISS | 15.4 | 4 |
Metrology area, Sub-field | Electricity and Magnetism, Resistance |
Description | COMPARISON OF RESISTANCE STANDARDS |
Time of measurements | 2020 - 2021 |
Status | Measurements in progress |
References | |
Measurand | DC Resistance 10 MΩ and 1 GΩ |
Transfer device | Two commercial resistors (Measurement International, models 9331 and 9331S) and two NIST-designed resistors at 10 MΩ and 1 GΩ, different from those which were used at the CCEM-K2.2012, are used. |
Comparison type | Key Comparison |
Consultative Committee | CCEM (Consultative Committee for Electricity and Magnetism) |
Conducted by | CCEM (Consultative Committee for Electricity and Magnetism) |
Comments | NIST and NRC share the pilot role. |
Pilot institute |
KRISS
Korea Research Institute of Standards and Science Korea, Republic of |
Contact person | Kwang Min Yu +82 42 868 5153 |
Additional |
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CCEM-K2.2012
MEASURAND Resistance
NOMINAL VALUE 10 MΩ
TRANSFER STANDARDS Two resistors 1100405 and 1101333
The key comparison reference value xR is computed from the weighted mean of the differences between each laborarory i and the pilot laboratory results and its associated standard uncertainty uR is obtained from the Equation 9 on page 12 of the Final Report.
xR = -0.11 ppm UR = 2uR = 0.55 ppm
The degree of equivalence of laboratory i relative to the key comparison reference value xR is given by a pair of terms, both expressed in ppm:
Di = (xi - xR) and its expanded uncertainty Ui (k = 2).
CCEM-K2.2012
MEASURAND Resistance
NOMINAL VALUE 1 GΩ
TRANSFER STANDARDS Two resistors 1100037 and 1101485
The key comparison reference value xR and its associated standard uncertainty uR are computed from the Equation 24 and 26 on page 19 of the Final Report.
xR = -4.15 ppm UR = 1.12 ppm
The degree of equivalence of laboratory i relative to the key comparison reference value xR is given by a pair of terms, both expressed in ppm:
Di and its expanded uncertainty Ui (k = 2) are computed as explained on page 19 of the Final Report.
CCEM-K2.2012
MEASURAND Resistance
NOMINAL VALUE 10 MΩ
TRANSFER STANDARDS Two resistors 1100405 and 1101333
Combined measurement results and uncertainties of laboratories participant in CCEM-K2.2012 are given in Table 6 of the Final Report.
Measurements were carried out between August 2012 and December 2016.
CCEM-K2.2012
MEASURAND Resistance
NOMINAL VALUE 1 GΩ
TRANSFER STANDARDS Two resistors 1100037 and 1101485
Combined measurement results and uncertainties of laboratories participant in CCEM-K2.2012 are given in Table 15 of the Final Report.
Measurements were carried out between August 2012 and December 2016.