BIPM.EM-K10 and EUROMET.EM.BIPM-K10.a
MEASURAND DC voltage, Josephson standard
NOMINAL VALUE 1.018 V
Degrees of equivalence represented by Di = (xI - xR) and its expanded uncertainty Ui at a 95 % level of confidence, both expressed in nV.
BIPM.EM-K10 at 1.018 V previously represented by BIPM.EM-K10.a
For higher resulution graph, please click here.
(a) now LNE
(b) now NMIJ AIST
(c) now VSL
(d) now RISE
(e) now INRiM
BIPM.EM-K10.b, SIM.EM.BIPM-K10.b, SIM.EM.BIPM-K10.b.1 and COOMET.EM.BIPM-K10.
MEASURAND DC voltage, Josephson standards
NOMINAL VALUE 10 V
Degrees of equivalence represented by Di = (xI - xR) and its expanded uncertainty Ui at a 95 % level of confidence, both expressed in nV.
BIPM.EM-K10 at 10 V previously represented by BIPM.EM-K10.b
For higher resolution graph, please click here.
(a) now RISE
(b) now NMIJ AIST
(c) now IPQ
(x) The degrees of equivalence are computed using the final result
BIPM.EM-K10 and EUROMET.EM.BIPM-K10.a
MEASURAND DC voltage, Josephson standard
NOMINAL VALUE 1.018 V
Degrees of equivalence represented by Di = (xI - xR) and its expanded uncertainty Ui at a 95 % level of confidence, both expressed in nV.
| LABi | Di | Uneg,i | Upos,i | |
|---|---|---|---|---|
nV |
nV |
nV |
||
| DFM | 0.20 | 0.6 | ||
| PTB | -0.10 | 0.6 | ||
| NIST | 0.10 | 0.6 | ||
| NRC | 0.20 | 0.6 | ||
| NPL | -0.07 | 1.0 | ||
| BNM-LCIE (a) | -0.12 | 0.3 | ||
| NMIJ (b) | -0.04 | 0.4 | ||
| NMi-VSL (c) | 0.20 | 0.4 | ||
| KRISS | 0.20 | 0.4 | ||
| MSL | -0.24 | 0.4 | ||
| NMIA | -0.02 | 0.3 | ||
| NIM | -0.01 | 0.2 | ||
| SP (d) | 0.10 | 0.6 | ||
| IEN (e) | 0.10 | 0.4 | ||
| CEM | 0.00 | 0.4 | ||
| NMC A*STAR | 1.80 | 1.8 | ||
| INTI | -1.06 | 4.0 | ||
| METAS | 0.28 | 0.9 | ||
| VNIIM | 0.0 | 0.5 | ||
| UME | 0.1 | 0.8 | ||
| PTB | 0.1 | 0.5 | ||
| SP | 0.0 | 2.3 | ||
| NPL | -1.2 | 1.2 | ||
| DFM | 0.2 | 1.1 | ||
| IEN | 0.0 | 0.7 | ||
| EIM | -0.9 | 4.5 | ||
| MIKES | 0.1 | 0.4 | ||
| GUM | 1.3 | 6.2 | ||
| CMI | -0.7 | 5.1 | ||
| NMi-VSL | 1.7 | 12.4 |
BIPM.EM-K10 at 1.018 V previously represented by BIPM.EM-K10.a
(a) now LNE
(b) now NMIJ AIST
(c) now VSL
(d) now RISE
(e) now INRiM
BIPM.EM-K10.b, SIM.EM.BIPM-K10.b, SIM.EM.BIPM-K10.b.1 and COOMET.EM.BIPM-K10.
MEASURAND DC voltage, Josephson standards
NOMINAL VALUE 10 V
Degrees of equivalence represented by Di = (xI - xR) and its expanded uncertainty Ui at a 95 % level of confidence, both expressed in nV.
| LABi | Di | Uneg,i | Upos,i | |
|---|---|---|---|---|
nV |
nV |
nV |
||
| SP (a) | 1.4 | 2.4 | ||
| SMU | 14.0 | 22.0 | ||
| NPL | -1.5 | 4.4 | ||
| NRC | 2.8 | 6.2 | ||
| CEM | 0.4 | 3.0 | ||
| NMIJ (b) | -1.2 | 2.6 | ||
| BEV | 1.1 | 7.0 | ||
| INETI (c) | 0.8 | 9.2 | ||
| INMETRO (2006) | 19.0 | 32.0 | ||
| NMIA | 0.9 | 3.4 | ||
| VSL | -1.5 | 3.6 | ||
| KRISS | 1.7 | 2.6 | ||
| LNE (x) | -0.1 | 0.2 | ||
| NIST (2006)(x) | -0.8 | 1.9 | ||
| SMD (x) | -0.4 | 2.7 | ||
| EIM (x) | -0.6 | 4.0 | ||
| NMC, A*STAR (x) | 0.4 | 1.9 | ||
| VNIIM (x) | -0.1 | 4.1 | ||
| CMI (x) | 9.6 | 20.6 | ||
| CENAM (x) | -0.6 | 1.3 | ||
| METAS | 0.3 | 2.0 | ||
| MSL (x) | 2.5 | 8.0 | ||
| NIM (x) | -0.2 | 1.8 | ||
| INM(RO) | 3.3 | 5.2 | ||
| PTB (x) | 0.7 | 1.0 | ||
| DMDM (x) | -0.1 | 3.0 | ||
| NIMT (x) | -1.0 | 5.2 | ||
| MIKES | 2.2 | 4.1 | ||
| NIST | 2.5 | 6.5 | ||
| INMETRO (2009) | 0.30 | 3.5 | ||
| BELGIM | 0.9 | 5.2 |
BIPM.EM-K10 at 10 V previously represented by BIPM.EM-K10.b
(a) now RISE
(b) now NMIJ AIST
(c) now IPQ
(x) The degrees of equivalence are computed using the final result
| Metrology area, Sub-field | Electricity and Magnetism, DC Voltage and Current |
| Description | DC voltage, Josephson standards |
| Time of measurements | 1991 - |
| Status | Continuous, approved for equivalence |
| References | |
| Measurand | DC voltage 1.018 V and 10 V |
| Transfer device | Josephson standard |
| Comparison type | Key Comparison |
| Consultative Committee | CCEM (Consultative Committee for Electricity and Magnetism) |
| Conducted by | BIPM (Bureau International des Poids et Mesures) |
| Comments | Most recent update of BIPM.EM-K10 results: 21 September 2021 From 21 September 2021, BIPM.EM-K10 covers the two former comparisons BIPM.EM-K10.a and BIPM.EM-K10.b. |
| Pilot institute |
BIPM
Bureau International des Poids et Mesures BIPM - International Organization |
| Contact person | S. Solve +33 (0) 1 45 07 70 26 |
| Pilot laboratory | |
|---|---|
| BIPM |
Bureau International des Poids et Mesures, BIPM - International Organization, N/A |
| BEV |
Bundesamt für Eich- und Vermessungswesen, Austria, EURAMET |
| 2005 |
| CEM |
Centro Español de Metrologia, Spain, EURAMET |
| 2005 | |
| 1997 |
| CENAM |
Centro Nacional de Metrologia, Mexico, SIM |
| 2011 |
| CMI |
Czech Metrology Institute, Czechia, EURAMET |
| 2011 |
| DFM |
Danish Fundamental Metrology A/S, Denmark, EURAMET |
| 1991 (May) | |
| 1991 (Jan) | |
| 1991 (Jan) |
| DMDM |
Directorate of Measures and Precious Metals, Serbia, EURAMET |
| 2015 |
| EIM |
Hellenic Institute of Metrology, Greece, EURAMET |
| 2010 |
| INM |
National Institute of Metrology, Romania, EURAMET |
| 2014 |
| INMETRO |
Instituto Nacional de Metrologia, Qualidade e Tecnologia, Brazil, SIM |
| 2006 |
| INRIM |
Istituto Nazionale di Ricerca Metrologica, Italy, EURAMET |
| 1996 |
| INTI |
Instituto Nacional de Tecnologia Industrial, Argentina, SIM |
| 2011 |
| IPQ |
Instituto Portugues da Qualidade, Portugal, EURAMET |
| 2006 |
| KRISS |
Korea Research Institute of Standards and Science, Korea, Republic of, APMP |
| 2008 | |
| 1995 |
| LNE |
Laboratoire national de métrologie et d'essais, France, EURAMET |
| 2007 | |
| 1994 | |
| 1992 | |
| 1991 |
| METAS |
Federal Institute of Metrology, Switzerland, EURAMET |
| 2012 |
Metrologia, 2012, 49, Tech. Suppl., 01010 |
| 1992 |
| MIKES |
VTT Technical Research Centre of Finland Ltd, Centre for Metrology/Mittatekniikan keskus, Finland, EURAMET |
| 2019 |
| MSL |
Measurement Standards Laboratory, New Zealand, APMP |
| 2011 | |
| 1995 |
| NIM |
National Institute of Metrology, China, APMP |
| 2013 | |
| 1995 |
| NIMT |
National Institute of Metrology (Thailand), Thailand, APMP |
| 2015 |
| NIST |
National Institute of Standards and Technology, United States, SIM |
| 2009 | |
| 1991 |
| NMC, A*STAR |
National Metrology Centre, Agency for Science, Technology and Research, Singapore, APMP |
| 2010 |
| NMIA |
National Measurement Institute, Australia, Australia, APMP |
| 2006 | |
| 1995 |
| NMIJ AIST |
National Metrology Institute of Japan, Japan, APMP |
| 2005 | |
| 1992 |
| NPL |
National Physical Laboratory, United Kingdom, EURAMET |
| 2004 | |
| 1992 |
| NRC |
National Research Council, Canada, SIM |
| 2004 | |
| 1991 |
| PTB |
Physikalisch-Technische Bundesanstalt, Germany, EURAMET |
| 2014 | |
| 1998 | |
| 1991 |
| RISE |
Research Institutes of Sweden AB, Sweden, EURAMET |
| 1996 | |
| 1998 |
| SMD |
Service de la Métrologie Belge, Belgium, EURAMET |
| 2009 |
| SMU |
Slovensky Metrologicky Ustav, Slovakia, EURAMET |
| 1999 |
| VNIIM |
D.I. Mendeleyev Institute for Metrology, Rosstandart, Russian Federation, COOMET |
| 2010 | |
| 2010 |
| VSL |
VSL, Netherlands, EURAMET |
| 2006 | |
| 1993 |
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BIPM.EM-K10 and EUROMET.EM.BIPM-K10.a
MEASURAND DC voltage, Josephson standard
NOMINAL VALUE 1.018 V
The key comparison reference value is the BIPM value. Its standard uncertainty is evaluated to be 0.1 nV and is included in the ui values.
The degree of equivalence between two laboratories i and j can be estimated as Dij = Di - Dj = (xi - xj) and its expanded uncertainty (k = 2), Uij, both expressed in nV, where Uij = 2[ui2 + uj2 - 2cov(i, j)]1/2. cov(i, j) << (0.1 nV)2 is the estimated covariance that takes into account the correlation introduced by the BIPM measurements. This term is negligible.
Linking EUROMET.EM.BIPM-K10.a to BIPM.EM-K10
The results issued from EUROMET.EM.BIPM-K10.a were linked to BIPM.EM-K10 via the BIPM who participated in both comparisons. Detailed information on the linking is given on page 6 of the EUROMET.EM.BIPM-K10.a Final Report.
BIPM.EM-K10.b, SIM.EM.BIPM-K10.b, SIM.EM.BIPM-K10.b.1 and COOMET.EM.BIPM-K10.
MEASURAND DC voltage, Josephson standards
NOMINAL VALUE 10 V
BIPM.EM-K10
The key comparison reference value is the BIPM value. Its standard uncertainty is evaluated to be 0.04 nV and is included in the ui values.
The degree of equivalence of laboratory i with respect to the key comparison reference value is given by a pair of terms:
Di = xi and its expanded uncertainty (k = 2), Ui = 2 ui, both expressed in nV.
When required, the degree of equivalence between two laboratories i and j can be estimated as Dij = Di - Dj = (xi - xj) and its expanded uncertainty (k = 2), Uij, both expressed in nV, where Uij = 2[ui2 + uj2 - 2cov(i, j)]1/2. cov(i, j) << (0.1 nV)2 is the estimated covariance that takes into account the correlation introduced by the BIPM measurements. This term is negligible.
Linking SIM.EM.BIPM-K10.b to BIPM.EM-K10
The results issued from SIM.EM.BIPM-K10.b were linked to BIPM.EM-K10 via NRC, having participated in both comparisons.
Linking SIM.EM.BIPM-K10.b.1 to BIPM.EM-K10
The results issued from SIM.EM.BIPM-K10.b.1 were linked to BIPM.EM-K10 via NIST, having participated in both comparisons.
Linking COOMET.EM.BIPM-K10.b to BIPM.EM-K10
The results issued from SIM.EM.BIPM-K10.b were linked to BIPM.EM-K10 via VNIIM, having participated in both comparisons.
BIPM.EM-K10 and EUROMET.EM.BIPM-K10.a
MEASURAND DC voltage, Josephson standard
NOMINAL VALUE 1.018 V
BIPM.EM-K10
xi measured voltage difference reported by laboratory i, Labi
ui combined standard uncertainty of xi
(a) now LNE
(b) now NMIJ AIST
(c) now VSL
(d) now RISE
(e) now INRiM
BIPM.EM-K10.b, SIM.EM.BIPM-K10.b, SIM.EM.BIPM-K10.b.1 and COOMET.EM.BIPM-K10.
MEASURAND DC voltage, Josephson standards
NOMINAL VALUE 10 V
BIPM.EM-K10
xi measured voltage difference reported by laboratory i, Labi
ui combined standard uncertainty of xi
(a) now RISE
(b) now NMIJ AIST
(c) now IPQ
(1) initial result
(2) final result following technical improvements during the comparison
