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Comparison
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CC comparison
Linked comparison
Metrology area, Sub-field Length, Dimensional Metrology
Description Nanometrology: line scale standards
Time of measurements 2000 - 2002
Status Approved
Final Reports of the comparisons
Measurand Main graduation: 4 µm line width, 1 mm line length, 1 mm pitch,
Auxiliary measuring line with test structures

Transfer device Two standards with identical layout (total length: 280 mm): one made of glass ceramic Zerodur, one made of fused silica
Comparison type Supplementary Comparison
Consultative Committee CCL (Consultative Committee for Length )
Conducted by CCL (Consultative Committee for Length )
Comments

 

 

Pilot institute PTB
Physikalisch-Technische Bundesanstalt
Germany
Contact person H. Bosse

+49 (0) 531 592 5200
First Name Last Name
wwww@ww.www +356719836 Institute 1 Institute 1 Khmelnitskiy
Pilot laboratory
PTB

Physikalisch-Technische Bundesanstalt, Germany, EURAMET

BNM-LNE

Bureau National de Métrologie - Laboratoire National d'Essais, France, EURAMET

CMS/ITRI

Industrial Technology Research Institute/Center for Measurement Standards, Chinese Taipei, APMP

CNR-IMGC

Consiglio Nazionale delle Ricerche - Istituto di Metrologia G. Colonnetti (until 2006), Italy, EURAMET

METAS

Federal Institute of Metrology, Switzerland, EURAMET

MIKES

VTT Technical Research Centre of Finland Ltd, Centre for Metrology/Mittatekniikan keskus, Finland, EURAMET

NIM

National Institute of Metrology, China, APMP

NIST

National Institute of Standards and Technology, United States, SIM

NMIJ AIST

National Metrology Institute of Japan, Japan, APMP

NRC

National Research Council, Canada, SIM

SP

Technical Research Institute of Sweden from 2017 Research Institutes of Sweden AB, Sweden, EURAMET

VNIIM

D.I. Mendeleyev Institute for Metrology, Rosstandart, Russian Federation, COOMET

Comparison
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Results
Comparison
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Results