MEASURAND : Length of gauge blocks
TRAVELLING STANDARDS : 10 steel gauge blocks
MEASURAND : Length of gauge blocks
TRAVELLING STANDARDS : 10 steel gauge blocks
Degrees of equivalence between KIM-LIPI and NMIJ
Results are presented under A4 printable format in Summary Results (.PDF file).
Metrology area, Sub-field | Length, Dimensional Metrology |
Description | Gauge blocks by interferometry |
Time of measurements | 2011 |
Status | Approved for equivalence |
Final Reports of the comparisons | |
Measurand | Central length: 0.5 mm to 100 mm |
Transfer device | Ten steel gauge blocks |
Comparison type | Key Comparison |
Consultative Committee | CCL (Consultative Committee for Length ) |
Conducted by | APMP (Asia Pacific Metrology Programme) |
Comments |
Results published on 23 April 2013 Gauge blocks by interferometry
|
Pilot institute |
NMIJ AIST
National Metrology Institute of Japan Japan |
Contact person | Akiko HIRAI +81 29 861 4283 |
Pilot laboratory | |
---|---|
NMIJ AIST |
National Metrology Institute of Japan, Japan, APMP |
Puslit KIM-LIPI |
Research Center for Calibration, Instrumentation and Metrology – Indonesian Institute of Sciences, Indonesia, APMP |
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MEASURAND : Length of gauge blocks
TRAVELLING STANDARDS : 10 steel gauge blocks
The aim of the data analysis is to establish the degrees of equivalence between the measurements performed by KIM-LIPI and NMIJ.
For each nominal value, the degree of equivalence between KIM-LIPI and NMIJ is given by a pair of terms, both expressed in nm: the offset DKIM-LIPI NMIJ = xKIM-LIPI - xNMIJ, and its expanded uncertainty (k = 2) UKIM-LIPI NMIJ = 2(uKIM-LIPI2 + uNMIJ2)1/2. The ratio of these two terms is also computed and presented under graphical form. |
MEASURAND : Length of gauge blocks
TRAVELLING STANDARDS : 10 steel gauge blocks
xi : average of the central length measured in two orientations by laboratory i, expressed as the deviation from nominal value
ui : combined standard uncertainty of xi
Dates of measurements: October 2011 for KIM-LIPI and November 2011 for NMIJ